Product Description
The InSEM HT high temperature nanoindentation test system allows independent tip and sample heating in a vacuum environment, and is compatible with many SEM/FIB chambers or standalone vacuum chambers. With temperatures ranging up to 800°C, extreme temperature conditions can be simulated in situ in order to produce consistent, reliable test data. Single-crystal tungsten carbide tips on a molybdenum holder are optimized for use in high temperature test applications, and are available in several geometries.
Features
- InForce 50 actuator with tip heating for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips
- Sample high temperature heating, up to 800°C with 10mm sample-size and vacuum-compatible sample mounting system
- InQuest high speed controller electronics with 100kHz data acquisition rate and 20µs time constant
- XYZ motion system for sample targeting
- SEM video capture for synchronized SEM images with test data
- Unique software-integrated tip-calibration system for fast, accurate tip calibration
- InView control and data review software with Windows® 10 compatibility and method developer for user-designed experiments
Applications
- High temperature nanoindentation testing
- Hardness and modulus measurements (Oliver-Pharr)
- Continuous stiffness measurement
- High speed material property maps
- Creep measurement
- Strain rate sensitivity
Industries
- Universities, research labs and institutes
- Aerospace
- Automotive manufacturing
- Hard coatings
- Nuclear energy
- Military/defense