Sheet Resistance Measurement
Sheet Resistance Measurement
Sheet resistance monitoring is critical to any industry that utilizes conductive films, from semiconductor manufacturing to the flexible electronics required to enable wearable technology. The Filmetrics® R-series sheet resistance measurement instruments have been developed based on over 45 years of KLA sheet resistance measurement innovation. Since the introduction of our first resistivity gauge in 1975, we have revolutionized both sheet resistance measurement and thickness measurement for conductive layers. The R50 measures metal layer thickness, sheet resistance and sheet conductance. The R54 – the latest innovation in KLA sheet resistance and conductivity mapping systems, adds a light-tight enclosure along with 300mm support, to provide metal thickness measurement solutions for semiconductor and compound semiconductor manufacturing.
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KLA will be attending the Johns Hopkins Mach Conference. Please come see us to discuss the advantages of our nanoindentation and optical profiling systems.
| Event Date | April 9 - 11, 2025 |
| Location | Graduate Hotel, Annapolis, MD |
Filmetrics® R54-200 Sheet Resistance Mapping System
The Filmetrics R54-200 advanced sheet resistance and conductivity mapping systems deliver R50 performance capability within a light-tight enclosure with additional capability to support semiconductor and compound semiconductor applications, including implant and epitaxial wafers.
The Filmetrics R54-200 can be configured as either direct four-point probe (R54-200-4PP) or non-contact eddy current system (R54-200-EC) and is compatible with all KLA sheet resistance probes.
Filmetrics® R54-300 Sheet Resistance Mapping System
The Filmetrics R54-300 advanced sheet resistance mapping system configuration maintains the small footprint of the 200mm system by employing a high precision X-Y-θ stage for superior edge exclusion and high-density mapping. The R54-300 delivers process optimization metrology in a compact benchtop package.
The Filmetrics R54-300 can be configured as either direct four-point probe (R54-300-4PP) or non-contact eddy current (R54-300-EC).
Filmetrics® R50-4PP Four-Point Probe System
The Filmetrics R50-4PP contact four-point probe system maps metal layer thickness, sheet resistance, sheet resistivity, sheet conductance, and sheet conductivity. The 10-decade measurement capability and large Z range make the R50-4PP ideal for a wide variety of applications.
The Filmetrics R50-200-4PP is also available to accommodate larger sample sizes.
Filmetrics® R50-EC Eddy Current System
The Filmetrics R50-EC non-contact eddy current system maps metal layer thickness, sheet resistance, sheet resistivity, sheet conductance, and sheet conductivity. The non-contact eddy current sheet resistance measurement is ideal for measuring resistance and film thickness on sensitive and/or flexible conductive surfaces.
The Filmetrics R50-200-EC is also available to accommodate larger sample sizes.
Looking for sheet resistance measurement tools for semiconductor chip manufacturing?
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