KLA’s Dr. Varun Gupta will host a poster “Detection of Yield Impacting Defects on GaN Substrate and Epitaxy Wafers” at the 13th International Conference on Nitride Semiconductors 2019 (ICNS-13). ICNS-13 will present high-impact scientific and technological advances in materials and devices based on group-III nitride semiconductors, and will feature plenary sessions, parallel topical sessions, poster sessions and an industrial exhibition.