KLA’s Dr. Yalin Xiong is an invited speaker at FCMN 2019, discussing “Advancement on optical inspection technology for 7nm or below process development and manufacturing.” The 2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. The conference will summarize major issues and provide critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.