KLA Instruments will be joining our local distributor TeknoTip to participate in the 17th International Nanoscience and Nanotechnology Conference. We invite you to stop by the TeknoTip/KLA Instruments booth for a demo of the Profilm3D^® optical profiler and the Filmetrics^® F20 film thickness measurement system.

KLA Instruments’ Tunzala Asgarova will be presenting “KLA Instruments for Thin Film Characterization” in Session 2-B on August 27 and “KLA Instruments for 3D Surface Characterization” in Session 7-A on August 29.

The annual NanoTR conference has become one of the most popular Nanotechnology conferences in the region. Researchers, scientists and experts from academia, institutions, and industry come together to highlight their current studies and share their latest knowledge in the field of nanoscience and nanotechnology.