KLA-Tencor will be exhibiting at CS International 2018. In addition to showcasing our compound semiconductor process control systems in our booth, Anoop Somanchi will present a talk entitled, "Defect Inspection and Process Control Solutions for Compound Semiconductor Materials" during the ‘Wrestling market share from silicon power devices’ session. We are pleased to announce that our Zeta-388 optical profiler for patterned sapphire substrate metrology was recognized by Compound Semi with their Metrology Award, which recognizes excellence in the compound semiconductor industry. CS International 2018 is the must-attend industry event for the compound semiconductor industry. The conference will provide an overview of the status of the compound semiconductor industry and the evolution of compound semiconductor devices; detailing breakthroughs in device technology and providing details of advances in tools and processes that will help to drive up fab yields. CS International 2018 will provide timely, comprehensive coverage of every important sector within the compound semiconductor industry.